AXRF-Q RF Sub-System for Semiconductor Test (Discontinued)
AXRF-Q is a Multi-Port RF Subsystem for testing RF semi-conductor components.
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Discontinued
Features
- Up to 32 bi-directional RF Test Ports
- Scalar & Vector Network Analysis
- Gain and Noise Figure measurement
- Wide Bandwidth Modulated Signal Generation and Analysis to 6 GHz
- Radio Communication Standards Personality Options
- Modular open architecture based on PXI/PXIe