Density, Scalability and Testing Speed
The VIAVI mOPM-C2B is the next great leap forward in dense, cost-effective, and reliable optical power metrology, specifically designed to meet the need for high channel count testing within a small footprint solution.
Engineered for precise measurements in an ultra dense package, the mOPM-C2B excels in applications like co-package optical technologies, MxN optical circuit switches, and ultra high density optical cables.
The mOPM-C2B offers flexible port configurations of 8, 16 or 24 ports in a single slot module, which allows a single 3U -slot mainframe o support up to 192 channels at the same time.
As a great leap forward, the mOPM-C2B upholds VIAVI's class leading specifications inside of an ultra dense and cost effective package. See the mOPM-C2B datasheet for detailed specifications.
Key Features and Benefits
• High Density: 8/16/24 ports power meter (192 ports in an 8-slot VIAVI MAP mainframe)
• Wide Wavelength Range: 1260 to 1640 nm
• Dynamic Range: +10 to -70 dBm
• High Resolution: 0.001 db
• 250K point buffer memory per channel
• 1μS sampling
• Triggered operation for synchronized measurements
• LC/PC or LC/APC
MAP Mainframe Interface

A single-slot module can accommodate up to 24 independent channels in the MAP-300 mainframe. This high-density design significantly enhances throughput and operational efficiency, particularly in environments with extensive multi-device and multiport testing requirements.
Super Application: OPMScope

The OPMScope application designed for use with the mOPM-C2B on the VIAVI MAP platform provides an intuitive tool for designers to graphically represent optical signals, much like a digital sampling scope, but in the optical domain.
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MAP-300 Multiple Application Platform
Third Generation optical test and measurement system that is optimized for compact cost-effective development and manufacturing of optical communications technology. -
MAP-220C Multiple Application Platform
Provides a flexible, more cost-effective compact platform for optical test switching and signal conditioning in optical device and sub-system development and manufacturing.
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